AMReX: a framework for block-structured adaptive mesh refinement

C++ Fortran C Submitted 23 March 2019Published 12 May 2019
Review

Editor: @kyleniemeyer (all papers)
Reviewers: @MatthewTurk (all reviews), @RemiLehe (all reviews), @cmsquared (all reviews)

Authors

Weiqun Zhang (0000-0001-8092-1974), Ann Almgren (0000-0003-2103-312X), Vince Beckner, John Bell (0000-0002-5749-334X), Johannes Blaschke (0000-0002-6024-3990), Cy Chan (0000-0001-6881-827X), Marcus Day (0000-0002-1711-3963), Brian Friesen (0000-0002-1572-1631), Kevin Gott (0000-0003-3244-5525), Daniel Graves (0000-0001-9730-7217), Max P. Katz (0000-0003-0439-4556), Andrew Myers (0000-0001-8427-8330), Tan Nguyen (0000-0003-3748-403X), Andrew Nonaka (0000-0003-1791-0265), Michele Rosso (0000-0001-8126-7425), Samuel Williams (0000-0002-8327-5717), Michael Zingale (0000-0001-8401-030X)

Citation

Zhang et al., (2019). AMReX: a framework for block-structured adaptive mesh refinement. Journal of Open Source Software, 4(37), 1370, https://doi.org/10.21105/joss.01370

@article{Zhang2019, doi = {10.21105/joss.01370}, url = {https://doi.org/10.21105/joss.01370}, year = {2019}, publisher = {The Open Journal}, volume = {4}, number = {37}, pages = {1370}, author = {Weiqun Zhang and Ann Almgren and Vince Beckner and John Bell and Johannes Blaschke and Cy Chan and Marcus Day and Brian Friesen and Kevin Gott and Daniel Graves and Max P. Katz and Andrew Myers and Tan Nguyen and Andrew Nonaka and Michele Rosso and Samuel Williams and Michael Zingale}, title = {AMReX: a framework for block-structured adaptive mesh refinement}, journal = {Journal of Open Source Software} }
Copy citation string · Copy BibTeX  
Tags

adaptive mesh refinement block-structured finite volume partial differential equations

Altmetrics
Markdown badge

 

License

Authors of JOSS papers retain copyright.

This work is licensed under a Creative Commons Attribution 4.0 International License.

Creative Commons License

Table of Contents
Public user content licensed CC BY 4.0 unless otherwise specified.
ISSN 2475-9066