DetectorChecker: analyzing patterns of defects in detector screens

R Submitted 03 July 2020Published 22 December 2020
Review

Editor: @fboehm (all papers)
Reviewers: @janfreyberg (all reviews), @craddm (all reviews)

Authors

Julia A. Brettschneider (0000-0003-1763-466X), Oscar T. Giles, Wilfrid S. Kendall (0000-0001-9799-3480), Tomas Lazauskas

Citation

Brettschneider et al., (2020). DetectorChecker: analyzing patterns of defects in detector screens. Journal of Open Source Software, 5(56), 2474, https://doi.org/10.21105/joss.02474

@article{Brettschneider2020, doi = {10.21105/joss.02474}, url = {https://doi.org/10.21105/joss.02474}, year = {2020}, publisher = {The Open Journal}, volume = {5}, number = {56}, pages = {2474}, author = {Julia A. Brettschneider and Oscar T. Giles and Wilfrid S. Kendall and Tomas Lazauskas}, title = {DetectorChecker: analyzing patterns of defects in detector screens}, journal = {Journal of Open Source Software} }
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XCT bad pixel map defective pixels spatial statistics

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ISSN 2475-9066